NMR and ESR: GE Omega 500 MHz FT NMR and a Varian Inova 300 routine access multinuclear FT NMR system. Bruker ESP 300 ESR spectrometer with accessories for low temperature work.
IR and UV/vis: Nicolet Magna-500 FTIR and a Nicolet 200 SXV FTIR with extended wavelength capabilities. UV/vis - HP 8453 Diode Array Spectrometer.
Mass spectroscopy: A Kratos MS-50TC RF with EI, CI, field desorption and FAB/LSIMS modes and a MALDI-TOF-MS are available for our use at the NIEHS-funded facility at Oregon State University in Corvallis. Intercampus shuttle is used to deliver samples on a daily basis.
X-ray diffraction: Enraf-Nonius CAD-4 and CAD-4 Turbo, both PC controlled.
Extensive HPLC facilities are available for our use in the Institute of Molecular Biology's shared instrument facility.
Several inert atmosphere dry boxes are available for our use.
Molecular modeling: Silicon Graphics Workstations and SPARTAN molecular modeling software.
Materials Characterization Laboratory
The Materials Characterization Laboratory houses instrumentation for the analysis of a wide range of samples, solid-state materials, surfaces, and organic and inorganic thin films. Instrumentation is cooperatively managed and maintained by members of the Department of Chemistry and members of the Materials Science Institute. including polymers, Philips X'Pert PW3040 Powder X-Ray Diffractometer. Optimized for the study of ultrathin films.
Scintag XDS2000 Powder X-Ray Diffractometer. Modified for variable temperature experiments.
Solid-state NMR. See INOVA 300 description in CRIS section.
SQUID Magnetometer
Kratos Analytical Ultra-High Vacuum Axis Hsi X-Ray Photoelectron Spectrometer (XPS). With monochromatic x-ray source, angle-resolution, and depth profiling capabilities.
Woollam M44 Spectroscopic Ellipsometer
Contact Angle Goniometer
Scanning Probe Microscope
Knauer Vapor Pressure Osmometer
Waters Gel Permeation Chromatography System. With both RI and UV/vis detectors
Modulated Differential Scanning Calorimeter and Thermogravimetric Analyzer
Device Fabrication and Electrical Characterization Laboratory
A semiconductor device physics and chemistry laboratory houses photolithography, high-vacuum deposition, and other semiconductor device processing equipment as well as instrumentation for the electrical characterization of materials and devices.
Additional Facilities
Individual laboratories house a range of deposition systems for molecular beam epitaxy, plasma-enhanced chemical vapor deposition, and UHV thin film deposition. Materials characterization facilities include cathodoluminescence imaging, capacitance spectroscopy, electrical and magnetic characterization (from 2 to 380K), surface preparation and characterization including a novel helium atom scattering apparatus, and electrochemical instrumentation.
Extensive SEM and TEM facilities are available for use in the University Electron Microscopy Facility (see below) and the Geology Electron Microprobe facility, which houses:
CAMECA SX50 Electron Microprobe
JEOL JSM-6300V Scanning Electron Microscope. Fitted with an energy dispersive x-ray detector (EDX)
Bioanalytical Systems BAS 100B/W electrochemical analysis system equipped with low current module.
Signatone Corporation Model SYS-301 In-line, four-point resistivity probe.
Contact Angle Goniometer (home built)
Polarizing microscope for investigation of liquid crystalline phases.
Perkin Elmer Applied Biosystems Model 430A automated solid phase peptide synthesizer.
Chemistry Department Facilities
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